LogoFAIL bugs in UEFI code allow planting bootkits via images

LogoFAIL bugs in UEFI code allow planting bootkits via images

December 1, 2023 at 11:26AM

LogoFAIL vulnerabilities, found within UEFI code’s image-parsing components, could let attackers hijack the boot process and deliver bootkits on various devices using ESP image file injection. Hundreds of devices across major vendors and architectures are at risk, with the full impact yet to be determined.

Meeting Takeaways:

1. LogoFAIL refers to security vulnerabilities affecting UEFI code image-parsing components across various vendors.
2. These vulnerabilities could be leveraged to control the boot process and deliver bootkits.
3. The broad impact of LogoFAIL extends to devices with x86 and ARM architectures.
4. The research by Binarly highlights the risks introduced by branding images during UEFI boot routines.
5. An attacker can exploit the vulnerabilities by placing a malicious image on the EFI System Partition (ESP) or within unsigned firmware update sections.
6. Successful exploitation can bypass security features like Secure Boot and hardware-based verification systems (e.g., Intel Boot Guard, AMD Hardware-Validated Boot, ARM TrustZone-based Secure Boot).
7. The potential impact of LogoFAIL is severe since it offers attackers a method to ensure system persistence and undetected malware execution.
8. LogoFAIL differs from runtime integrity attacks like BootHole or BlackLotus as it doesn’t modify the bootloader or firmware.
9. Hundreds of consumer and enterprise devices by major manufacturers such as Intel, Acer, and Lenovo are potentially vulnerable.
10. Three major independent UEFI firmware code providers (AMI, Insyde, and Phoenix) are also implicated.
11. The full scope of LogoFAIL’s impact is still being assessed.
12. Technical details about LogoFAIL will be presented on December 6 at the Black Hat Europe security conference in London.
13. Device vendors and UEFI code providers have been notified of the researchers’ findings.

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